Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films: Fid-Bau Portal

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

Gianola, D. S. / Mendis, B. G. / Cheng, X. M. / Hemker, K. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

Gianola, D. S. / Mendis, B. G. / Cheng, X. M. / Hemker, K. J.

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

Gianola, D. S. / Mendis, B. G. / Cheng, X. M. / Hemker, K. J.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films

Contributors:

Gianola, D. S. (author) / Mendis, B. G. (author) / Cheng, X. M. (author) / Hemker, K. J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 483/484 ; 637-640

Publication date:

2008-01-01

Size:

4 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Streitenberger, P. / Zollner, D. | British Library Online Contents | 2012

Effect of Annealing Conditions on the Grain Size of Nanocrystalline Copper Thin Films

Simoes, S. / Calinas, R. / Ferreira, P.J. et al. | British Library Online Contents | 2008

Grain growth, stress, and impurities in electroplated copper

Brongersma, S. H. / Kerr, E. / Vervoort, I. et al. | British Library Online Contents | 2002

Grain-size effect on the electrical properties of nanocrystalline indium tin oxide thin films

Lee, J. H. / Kim, Y. H. / Ahn, S. J. et al. | British Library Online Contents | 2015

Nanoscale planar faulting in nanocrystalline Ni-W thin films: Grain growth, segregation, and residual stress

Welzel, U. / Kummel, J. / Bischoff, E. et al. | British Library Online Contents | 2011