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Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films
Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films
Grain-size stabilization by impurities and effect on stress-coupled grain growth in nanocrystalline Al thin films
Gianola, D. S. (author) / Mendis, B. G. (author) / Cheng, X. M. (author) / Hemker, K. J. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 483/484 ; 637-640
2008-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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