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RBS, XRR and optical reflectivity measurements of Ti-TiO"2 thin films deposited by magnetron sputtering
RBS, XRR and optical reflectivity measurements of Ti-TiO"2 thin films deposited by magnetron sputtering
RBS, XRR and optical reflectivity measurements of Ti-TiO"2 thin films deposited by magnetron sputtering
Drogowska, K. (author) / Tarnawski, Z. (author) / Brudnik, A. (author) / Kusior, E. (author) / Sokolowski, M. (author) / Zakrzewska, K. (author) / Reszka, A. (author) / Kim-Ngan, N. T. H. (author) / Balogh, A. G. (author)
MATERIALS RESEARCH BULLETIN ; 47 ; 296-301
2012-01-01
6 pages
Article (Journal)
English
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