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    Field-emission-induced electromigration method for the integration of single-electron transistors

    New search for: Ueno, S.
    New search for: Tomoda, Y.
    New search for: Kume, W.
    New search for: Hanada, M.
    New search for: Takiya, K.
    New search for: Shirakashi, J. i.

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    Field-emission-induced electromigration method for the integration of single-electron transistors

    New search for: Ueno, S.
    New search for: Tomoda, Y.
    New search for: Kume, W.
    New search for: Hanada, M.
    New search for: Takiya, K.
    New search for: Shirakashi, J. i.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Field-emission-induced electromigration method for the integration of single-electron transistors

    New search for: Ueno, S.
    New search for: Tomoda, Y.
    New search for: Kume, W.
    New search for: Hanada, M.
    New search for: Takiya, K.
    New search for: Shirakashi, J. i.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Field-emission-induced electromigration method for the integration of single-electron transistors

    Contributors:

    Ueno, S. (author) / Tomoda, Y. (author) / Kume, W. (author) / Hanada, M. (author) / Takiya, K. (author) / Shirakashi, J. i. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 2153-2156

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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