An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition: Fid-Bau Portal

An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition

Ghumman, C. A. / Moutinho, A. M. / Santos, A. / Teodoro, O. M. / Tolstogouzov, A.

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An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition

Ghumman, C. A. / Moutinho, A. M. / Santos, A. / Teodoro, O. M. / Tolstogouzov, A.

An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition

Ghumman, C. A. / Moutinho, A. M. / Santos, A. / Teodoro, O. M. / Tolstogouzov, A.

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Title:

An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition

Contributors:

Ghumman, C. A. (author) / Moutinho, A. M. (author) / Santos, A. (author) / Teodoro, O. M. (author) / Tolstogouzov, A. (author)

Published in:

APPLIED SURFACE SCIENCE ; 258 ; 2490-2497

Publication date:

2012-01-01

Size:

8 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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