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Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition
An upgraded TOF-SIMS VG Ionex IX23LS: Study on the negative secondary ion emission of III-V compound semiconductors with prior neutral cesium deposition
Ghumman, C. A. (Autor:in) / Moutinho, A. M. (Autor:in) / Santos, A. (Autor:in) / Teodoro, O. M. (Autor:in) / Tolstogouzov, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 2490-2497
01.01.2012
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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