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Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Ejiri, S. / Sasaki, T. / Hirose, Y.

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Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Ejiri, S. / Sasaki, T. / Hirose, Y.

Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Ejiri, S. / Sasaki, T. / Hirose, Y.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Contributors:

Ejiri, S. (author) / Sasaki, T. (author) / Hirose, Y. (author) / Chandra, T. / Ionescu, M. / Mantovani, D.

Published in:

THERMEC 2011 ; 1673-1678

MATERIALS SCIENCE FORUM ; 706/709

Publication date:

2012-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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