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X-ray diffraction analysis of residual stresses in textured ZnO thin films

Dobročka, E. / Novák, P. / Búc, D. / Harmatha, L. / Murín, J.

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X-ray diffraction analysis of residual stresses in textured ZnO thin films

Dobročka, E. / Novák, P. / Búc, D. / Harmatha, L. / Murín, J.

X-ray diffraction analysis of residual stresses in textured ZnO thin films

Dobročka, E. / Novák, P. / Búc, D. / Harmatha, L. / Murín, J.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

X-ray diffraction analysis of residual stresses in textured ZnO thin films

Contributors:

Dobročka, E. (author) / Novák, P. (author) / Búc, D. (author) / Harmatha, L. (author) / Murín, J. (author)

Published in:

Applied surface science ; 395 ; 16-23

Publication date:

2017-01-01

Size:

8 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.44

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