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Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations

Miccoli, C. / Martino, V.C. / Rinaudo, S.

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Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations

Miccoli, C. / Martino, V.C. / Rinaudo, S.

Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations

Miccoli, C. / Martino, V.C. / Rinaudo, S.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations

Contributors:

Miccoli, C. (author) / Martino, V.C. (author) / Rinaudo, S. (author) / Alquier, D.

Published in:

HeteroSiC & WASMPE 2011 ; 218-222

MATERIALS SCIENCE FORUM ; 711

Publication date:

2012-01-01

Size:

5 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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