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Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations
Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations
Comprehensive Analysis of Process Variability on AlGaN/GaN HEMTs through TCAD Simulations
Miccoli, C. (Autor:in) / Martino, V.C. (Autor:in) / Rinaudo, S. (Autor:in) / Alquier, D.
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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