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    Defects in TiO2 films on p^+-Si studied by positron annihilation spectroscopy

    New search for: Coleman, P. G.
    New search for: Edwardson, C. J.
    New search for: Zhang, A.
    New search for: Ma, X.
    New search for: Pi, X.
    New search for: Yang, D.

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    Defects in TiO2 films on p^+-Si studied by positron annihilation spectroscopy

    New search for: Coleman, P. G.
    New search for: Edwardson, C. J.
    New search for: Zhang, A.
    New search for: Ma, X.
    New search for: Pi, X.
    New search for: Yang, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defects in TiO2 films on p^+-Si studied by positron annihilation spectroscopy

    New search for: Coleman, P. G.
    New search for: Edwardson, C. J.
    New search for: Zhang, A.
    New search for: Ma, X.
    New search for: Pi, X.
    New search for: Yang, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Defects in TiO2 films on p^+-Si studied by positron annihilation spectroscopy

    Contributors:

    Coleman, P. G. (author) / Edwardson, C. J. (author) / Zhang, A. (author) / Ma, X. (author) / Pi, X. (author) / Yang, D. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 177 ; 625-628

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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