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Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

Domínguez, J. / Mass, J. / Moralejo, B. / Martínez, O. / Jiménez, J. / Ardila, A. M. / Parra, V.

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Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

Domínguez, J. / Mass, J. / Moralejo, B. / Martínez, O. / Jiménez, J. / Ardila, A. M. / Parra, V.

Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

Domínguez, J. / Mass, J. / Moralejo, B. / Martínez, O. / Jiménez, J. / Ardila, A. M. / Parra, V.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

Contributors:

Domínguez, J. (author) / Mass, J. (author) / Moralejo, B. (author) / Martínez, O. (author) / Jiménez, J. (author) / Ardila, A. M. (author) / Parra, V. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 47 ; 5470-5476

Publication date:

2012-01-01

Size:

7 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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