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Microstructural Characteristics of InGaZnO Thin Film Using an Electrical Current Method

Chen, Y.-T. / Hung, F.-Y. / Chang, S.-J. / Lui, T.-S. / Chen, L.-H.

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Microstructural Characteristics of InGaZnO Thin Film Using an Electrical Current Method

Chen, Y.-T. / Hung, F.-Y. / Chang, S.-J. / Lui, T.-S. / Chen, L.-H.

Microstructural Characteristics of InGaZnO Thin Film Using an Electrical Current Method

Chen, Y.-T. / Hung, F.-Y. / Chang, S.-J. / Lui, T.-S. / Chen, L.-H.

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Document information

Title:

Microstructural Characteristics of InGaZnO Thin Film Using an Electrical Current Method

Contributors:

Chen, Y.-T. (author) / Hung, F.-Y. (author) / Chang, S.-J. (author) / Lui, T.-S. (author) / Chen, L.-H. (author)

Published in:

MATERIALS TRANSACTIONS ; 53 ; 733-738

Publication date:

2012-01-01

Size:

6 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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