Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes: Fid-Bau Portal

Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes

Stahlbush, R.E. / Zhang, Q.C. / Agarwal, A.K. / Mahadik, N.A.

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Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes

Stahlbush, R.E. / Zhang, Q.C. / Agarwal, A.K. / Mahadik, N.A.

Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes

Stahlbush, R.E. / Zhang, Q.C. / Agarwal, A.K. / Mahadik, N.A.

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Document information

Title:

Effect of Stacking Faults Originating from Half Loop Arrays on Electrical Behavior of 10 kV 4H-SiC PiN Diodes

Contributors:

Stahlbush, R.E. (author) / Zhang, Q.C. (author) / Agarwal, A.K. (author) / Mahadik, N.A. (author)

Published in:

MATERIALS SCIENCE FORUM ; 717/720 ; 387-390

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Maximenko, S. I. / Pirouz, P. / Sudarshan, T. S. | British Library Online Contents | 2006

Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Fatemi, M. et al. | British Library Online Contents | 2004

Microstructural Characterization of Recombination-Induced Stacking Faults in High-Voltage SiC Diodes

Liu, J. Q. / Skowronski, M. / Hallin, C. et al. | British Library Online Contents | 2002

Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

Jacobson, H. / Bergman, J. P. / Hallin, C. et al. | British Library Online Contents | 2003

EBIC study on the electrical activity of stacking faults in silicon

Sekiguchi, T. / Shen, B. / Watanabe, T. et al. | British Library Online Contents | 1996