Recombination Behavior of Stacking Faults in SiC p-i-n Diodes

Maximenko, S. I. / Pirouz, P. / Sudarshan, T. S. | British Library Online Contents | 2006

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. et al. | British Library Online Contents | 2002

Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Fatemi, M. et al. | British Library Online Contents | 2004

Reduction of Stacking Faults in Fast Epitaxial Growth of 4H-SiC and its Impacts on High-Voltage Schottky Diodes

Fujiwara, H. / Kimoto, T. / Tojo, T. et al. | British Library Online Contents | 2005

Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

Jacobson, H. / Bergman, J. P. / Hallin, C. et al. | British Library Online Contents | 2003