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Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC(0001) Si-Face and (000-1) C-Face Substrates
Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC(0001) Si-Face and (000-1) C-Face Substrates
Synchrotron Radiation Photoelectron Spectroscopy Study of Thermally Grown Oxides on 4H-SiC(0001) Si-Face and (000-1) C-Face Substrates
Watanabe, H. (author) / Hosoi, T. (author) / Kirino, T. (author) / Uenishi, Y. (author) / Chanthaphan, A. (author) / Yoshigoe, A. (author) / Teraoka, Y. (author) / Mitani, S. (author) / Nakano, Y. (author) / Nakamura, T. (author)
MATERIALS SCIENCE FORUM ; 717/720 ; 697-702
2012-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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