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    Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films

    New search for: Kim, H. K.
    New search for: Kim, N. H.
    New search for: Choi, D. J.

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    Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films

    New search for: Kim, H. K.
    New search for: Kim, N. H.
    New search for: Choi, D. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films

    New search for: Kim, H. K.
    New search for: Kim, N. H.
    New search for: Choi, D. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of the crystallization process and crystal structure of Si-incorporated GeSb phase-change films

    Contributors:

    Kim, H. K. (author) / Kim, N. H. (author) / Choi, D. J. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 47 ; 6679-6687

    Publication date:

    2012-01-01

    Size:

    9 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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