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    Observation of Short-wavelength Recorded Pits in GeSb~2Te~4 Phase Change Thin Film by Atomic Force Microscopy

    New search for: Men, L.
    New search for: Gan, F.
    New search for: Sun, J.
    New search for: Li, M.

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    Observation of Short-wavelength Recorded Pits in GeSb~2Te~4 Phase Change Thin Film by Atomic Force Microscopy

    New search for: Men, L.
    New search for: Gan, F.
    New search for: Sun, J.
    New search for: Li, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Observation of Short-wavelength Recorded Pits in GeSb~2Te~4 Phase Change Thin Film by Atomic Force Microscopy

    New search for: Men, L.
    New search for: Gan, F.
    New search for: Sun, J.
    New search for: Li, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Observation of Short-wavelength Recorded Pits in GeSb~2Te~4 Phase Change Thin Film by Atomic Force Microscopy

    Contributors:

    Men, L. (author) / Gan, F. (author) / Sun, J. (author) / Li, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 120 ; 171-179

    Publication date:

    1997-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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