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    The temperature dependent analysis of Au/TiO"2 (rutile)/n-Si (MIS) SBDs using current-voltage-temperature (I-V-T) characteristics

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    New search for: Sebnem Cetin, S.
    New search for: Bengi, A.
    New search for: Ozcelik, S.

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    The temperature dependent analysis of Au/TiO"2 (rutile)/n-Si (MIS) SBDs using current-voltage-temperature (I-V-T) characteristics

    New search for: Kinaci, B.
    New search for: Sebnem Cetin, S.
    New search for: Bengi, A.
    New search for: Ozcelik, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The temperature dependent analysis of Au/TiO"2 (rutile)/n-Si (MIS) SBDs using current-voltage-temperature (I-V-T) characteristics

    New search for: Kinaci, B.
    New search for: Sebnem Cetin, S.
    New search for: Bengi, A.
    New search for: Ozcelik, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    The temperature dependent analysis of Au/TiO"2 (rutile)/n-Si (MIS) SBDs using current-voltage-temperature (I-V-T) characteristics

    Contributors:

    Kinaci, B. (author) / Sebnem Cetin, S. (author) / Bengi, A. (author) / Ozcelik, S. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 15 ; 531-535

    Publication date:

    2012-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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