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    Investigation of temperature dependent negative capacitance in the forward bias C-V characteristics of (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs)

    New search for: Güçlü, Ç.Ş.
    New search for: Özdemir, A.F.
    New search for: Karabulut, A.
    New search for: Kökce, A.
    New search for: Altındal, Ş.

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    Investigation of temperature dependent negative capacitance in the forward bias C-V characteristics of (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs)

    New search for: Güçlü, Ç.Ş.
    New search for: Özdemir, A.F.
    New search for: Karabulut, A.
    New search for: Kökce, A.
    New search for: Altındal, Ş.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of temperature dependent negative capacitance in the forward bias C-V characteristics of (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs)

    New search for: Güçlü, Ç.Ş.
    New search for: Özdemir, A.F.
    New search for: Karabulut, A.
    New search for: Kökce, A.
    New search for: Altındal, Ş.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Investigation of temperature dependent negative capacitance in the forward bias C-V characteristics of (Au/Ti)/Al2O3/n-GaAs Schottky barrier diodes (SBDs)

    Contributors:

    Güçlü, Ç.Ş. (author) / Özdemir, A.F. (author) / Karabulut, A. (author) / Kökce, A. (author) / Altındal, Ş. (author)

    Published in:

    Materials science in semiconductor processing ; 89 ; 26-31

    Publication date:

    2019-01-01

    Size:

    6 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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