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    Formation and Annealing Behavior of Copper Centers in Silicon Crystal Measured by Photoluminescence and Deep-Level Transient Spectroscopy

    New search for: Nakamura, M.
    New search for: Murakami, S.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

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    Formation and Annealing Behavior of Copper Centers in Silicon Crystal Measured by Photoluminescence and Deep-Level Transient Spectroscopy

    New search for: Nakamura, M.
    New search for: Murakami, S.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Formation and Annealing Behavior of Copper Centers in Silicon Crystal Measured by Photoluminescence and Deep-Level Transient Spectroscopy

    New search for: Nakamura, M.
    New search for: Murakami, S.
    New search for: Yamada-Kaneta, H.
    New search for: Sakai, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Formation and Annealing Behavior of Copper Centers in Silicon Crystal Measured by Photoluminescence and Deep-Level Transient Spectroscopy

    Contributors:

    Nakamura, M. (author) / Murakami, S. (author) / Yamada-Kaneta, H. / Sakai, A.

    Published in:

    Defects-Recognition, Imaging and Physics in Semiconductors XIV ; 209-212

    MATERIALS SCIENCE FORUM ; 725

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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