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    Accurate measurement of thickness of large-area graphene layers by neutron reflectometry

    New search for: Jang, Y. R.
    New search for: Kim, K. Y.
    New search for: Yoo, K. H.

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    Accurate measurement of thickness of large-area graphene layers by neutron reflectometry

    New search for: Jang, Y. R.
    New search for: Kim, K. Y.
    New search for: Yoo, K. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Accurate measurement of thickness of large-area graphene layers by neutron reflectometry

    New search for: Jang, Y. R.
    New search for: Kim, K. Y.
    New search for: Yoo, K. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Accurate measurement of thickness of large-area graphene layers by neutron reflectometry

    Contributors:

    Jang, Y. R. (author) / Kim, K. Y. (author) / Yoo, K. H. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 51 ; 10059-10065

    Publication date:

    2016-01-01

    Size:

    7 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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