Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy

    New search for: Wu, Y.
    New search for: Yu, N.
    New search for: Liu, D.
    New search for: He, Y.
    New search for: Liu, Y.
    New search for: Liang, H.
    New search for: Du, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy

    New search for: Wu, Y.
    New search for: Yu, N.
    New search for: Liu, D.
    New search for: He, Y.
    New search for: Liu, Y.
    New search for: Liang, H.
    New search for: Du, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy

    New search for: Wu, Y.
    New search for: Yu, N.
    New search for: Liu, D.
    New search for: He, Y.
    New search for: Liu, Y.
    New search for: Liang, H.
    New search for: Du, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy

    Contributors:

    Wu, Y. (author) / Yu, N. (author) / Liu, D. (author) / He, Y. (author) / Liu, Y. (author) / Liang, H. (author) / Du, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 265 ; 176-179

    Publication date:

    2013-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

    Yahata, A. / Zhang, L. / Shinohe, T. | British Library Online Contents | 2002

    Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

    Muhunthan, N. / Singh, Om Pal / Toutam, Vijaykumar et al. | British Library Online Contents | 2015

    Electrical characterization of epitaxial FeSi~2 nanowire on Si (110) by conductive-atomic force microscopy

    Liang, S. / Ashcroft, B.A. | British Library Online Contents | 2010

    Atomic Force Microscopy

    West, P. / Starostina, N. | British Library Online Contents | 2004

    Atomic Force Microscopy

    Blanchard, C. R. / Campbell, J. B. | British Library Online Contents | 1995

    Back to top