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    Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

    New search for: Yahata, A.
    New search for: Zhang, L.
    New search for: Shinohe, T.

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    Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

    New search for: Yahata, A.
    New search for: Zhang, L.
    New search for: Shinohe, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

    New search for: Yahata, A.
    New search for: Zhang, L.
    New search for: Shinohe, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

    Contributors:

    Yahata, A. (author) / Zhang, L. (author) / Shinohe, T. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 389/393 ; 667-670

    Publication date:

    2002-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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