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    Electrical characterization of epitaxial FeSi~2 nanowire on Si (110) by conductive-atomic force microscopy

    New search for: Liang, S.
    New search for: Ashcroft, B.A.

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    Electrical characterization of epitaxial FeSi~2 nanowire on Si (110) by conductive-atomic force microscopy

    New search for: Liang, S.
    New search for: Ashcroft, B.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical characterization of epitaxial FeSi~2 nanowire on Si (110) by conductive-atomic force microscopy

    New search for: Liang, S.
    New search for: Ashcroft, B.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Electrical characterization of epitaxial FeSi~2 nanowire on Si (110) by conductive-atomic force microscopy

    Contributors:

    Liang, S. (author) / Ashcroft, B.A. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 25 ; 213-218

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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