Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Thermal Runaway Robustness of SiC VJFETs

    New search for: Ouaida, R.
    New search for: Buttay, C.
    New search for: Hoang, A.
    New search for: Riva, R.
    New search for: Bergogne, D.
    New search for: Morel, H.
    New search for: Raynaud, C.
    New search for: Morel, F.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Thermal Runaway Robustness of SiC VJFETs

    New search for: Ouaida, R.
    New search for: Buttay, C.
    New search for: Hoang, A.
    New search for: Riva, R.
    New search for: Bergogne, D.
    New search for: Morel, H.
    New search for: Raynaud, C.
    New search for: Morel, F.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal Runaway Robustness of SiC VJFETs

    New search for: Ouaida, R.
    New search for: Buttay, C.
    New search for: Hoang, A.
    New search for: Riva, R.
    New search for: Bergogne, D.
    New search for: Morel, H.
    New search for: Raynaud, C.
    New search for: Morel, F.
    New search for: Lebedev, A.A.
    New search for: Davydov, S.Y.
    New search for: Ivanov, P.A.
    New search for: Levinshtein, M.E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thermal Runaway Robustness of SiC VJFETs

    Contributors:

    Ouaida, R. (author) / Buttay, C. (author) / Hoang, A. (author) / Riva, R. (author) / Bergogne, D. (author) / Morel, H. (author) / Raynaud, C. (author) / Morel, F. (author) / Lebedev, A.A. / Davydov, S.Y.

    Published in:

    Silicon Carbide and Related Materials 2012 Selected, peer reviewed papers from the 9th European Conference on Silicon Carbide and Related Materials (ECSCRM 2012), September 2-6, 2012, St. Petersburg, Russian Federation ; 929-933

    MATERIALS SCIENCE FORUM ; 740/742

    Publication date:

    2013-01-01

    Size:

    5 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Electro-Thermal SPICE Model for High-Voltage SiC VJFETs

    Elpelt, R. / Friedrichs, P. / Hippeli, J. et al. | British Library Online Contents | 2009

    Fast Switching with SiC VJFETs - Influence of the Device Topology

    Elpelt, R. / Friedrichs, P. / Biela, J. | British Library Online Contents | 2010

    High-Voltage Modular Switch Based on SiC VJFETs - First Results for a Fast 4.5kV/1.2Omega Configuration

    Friedrichs, P. / Mitlehner, H. / Schorner, R. et al. | British Library Online Contents | 2003

    Electrical Characterization of Large Area 800 V Enhancement-Mode SiC VJFETs for High Temperature Applications

    Ritenour, A. / Bondarenko, V. / Kelley, R.L. et al. | British Library Online Contents | 2009

    Performance of 15 mm^2 1200 V Normally-Off SiC VJFETs with 120 A Saturation Current

    Ritenour, A. / Sheridan, D.C. / Bondarenko, V. et al. | British Library Online Contents | 2010

    Back to top