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    Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped silicon nanocrystal thin films

    New search for: Huang, J.
    New search for: Zeng, Y.
    New search for: Tan, R.
    New search for: Wang, W.
    New search for: Yang, Y.
    New search for: Dai, N.
    New search for: Song, W.

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    Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped silicon nanocrystal thin films

    New search for: Huang, J.
    New search for: Zeng, Y.
    New search for: Tan, R.
    New search for: Wang, W.
    New search for: Yang, Y.
    New search for: Dai, N.
    New search for: Song, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped silicon nanocrystal thin films

    New search for: Huang, J.
    New search for: Zeng, Y.
    New search for: Tan, R.
    New search for: Wang, W.
    New search for: Yang, Y.
    New search for: Dai, N.
    New search for: Song, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Effects of substrate temperature on structural and electrical properties of SiO2-matrix boron-doped silicon nanocrystal thin films

    Contributors:

    Huang, J. (author) / Zeng, Y. (author) / Tan, R. (author) / Wang, W. (author) / Yang, Y. (author) / Dai, N. (author) / Song, W. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 270 ; 428-431

    Publication date:

    2013-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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