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    Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

    New search for: Zhang, D.
    New search for: Wang, Y.
    New search for: Gan, Y.

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    Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

    New search for: Zhang, D.
    New search for: Wang, Y.
    New search for: Gan, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

    New search for: Zhang, D.
    New search for: Wang, Y.
    New search for: Gan, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Characterization of critically cleaned sapphire single-crystal substrates by atomic force microscopy, XPS and contact angle measurements

    Contributors:

    Zhang, D. (author) / Wang, Y. (author) / Gan, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 274 ; 405-417

    Publication date:

    2013-01-01

    Size:

    13 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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