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    Crystallographic shear planes in nanocrystalline SnO~2 thin films by high-resolution transmission electron microscopy

    New search for: Zheng, J. G.
    New search for: Pan, X.
    New search for: Schweizer, M.
    New search for: Weimar, U.
    New search for: Goepel, W.
    New search for: Ruehle, M.

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    Crystallographic shear planes in nanocrystalline SnO~2 thin films by high-resolution transmission electron microscopy

    New search for: Zheng, J. G.
    New search for: Pan, X.
    New search for: Schweizer, M.
    New search for: Weimar, U.
    New search for: Goepel, W.
    New search for: Ruehle, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Crystallographic shear planes in nanocrystalline SnO~2 thin films by high-resolution transmission electron microscopy

    New search for: Zheng, J. G.
    New search for: Pan, X.
    New search for: Schweizer, M.
    New search for: Weimar, U.
    New search for: Goepel, W.
    New search for: Ruehle, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Crystallographic shear planes in nanocrystalline SnO~2 thin films by high-resolution transmission electron microscopy

    Contributors:

    Zheng, J. G. (author) / Pan, X. (author) / Schweizer, M. (author) / Weimar, U. (author) / Goepel, W. (author) / Ruehle, M. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 31 ; 2317-2324

    Publication date:

    1996-01-01

    Size:

    8 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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