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    Spectroellipsometric characterization of nanocrystalline diamond layers

    New search for: Lohner, T.
    New search for: Csikvari, P.
    New search for: Petrik, P.
    New search for: Hars, G.

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    Spectroellipsometric characterization of nanocrystalline diamond layers

    New search for: Lohner, T.
    New search for: Csikvari, P.
    New search for: Petrik, P.
    New search for: Hars, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroellipsometric characterization of nanocrystalline diamond layers

    New search for: Lohner, T.
    New search for: Csikvari, P.
    New search for: Petrik, P.
    New search for: Hars, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Spectroellipsometric characterization of nanocrystalline diamond layers

    Contributors:

    Lohner, T. (author) / Csikvari, P. (author) / Petrik, P. (author) / Hars, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 281 ; 113-117

    Publication date:

    2013-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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