Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Spectroellipsometric characterization of nanocrystalline diamond layers
Spectroellipsometric characterization of nanocrystalline diamond layers
Spectroellipsometric characterization of nanocrystalline diamond layers
Lohner, T. (Autor:in) / Csikvari, P. (Autor:in) / Petrik, P. (Autor:in) / Hars, G. (Autor:in)
APPLIED SURFACE SCIENCE ; 281 ; 113-117
01.01.2013
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Spectroellipsometric characterization of materials for multilayer coatings
British Library Online Contents | 2001
|Spectroellipsometric characterisation of thin epitaxial Si~1~-~xGe~x layers
British Library Online Contents | 1995
|Spectroellipsometric characterization of Au-Y~2O~3-stabilized ZrO~2 nanocomposite films
British Library Online Contents | 2005
|Spectroellipsometric Method for Process Monitoring of Semiconductor Thin Films and Interfaces
British Library Online Contents | 1998
|British Library Online Contents | 2002
|