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    Effect of Rapid Thermal Annealing on the Electrical and Structural Properties of Se Schottky Contacts to n-Type Si

    New search for: Janardhanam, V.
    New search for: Kil, Y.-H.
    New search for: Shim, K.-H.
    New search for: Reddy, V.R.
    New search for: Choi, C.-J.

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    Effect of Rapid Thermal Annealing on the Electrical and Structural Properties of Se Schottky Contacts to n-Type Si

    New search for: Janardhanam, V.
    New search for: Kil, Y.-H.
    New search for: Shim, K.-H.
    New search for: Reddy, V.R.
    New search for: Choi, C.-J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of Rapid Thermal Annealing on the Electrical and Structural Properties of Se Schottky Contacts to n-Type Si

    New search for: Janardhanam, V.
    New search for: Kil, Y.-H.
    New search for: Shim, K.-H.
    New search for: Reddy, V.R.
    New search for: Choi, C.-J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Effect of Rapid Thermal Annealing on the Electrical and Structural Properties of Se Schottky Contacts to n-Type Si

    Contributors:

    Janardhanam, V. (author) / Kil, Y.-H. (author) / Shim, K.-H. (author) / Reddy, V.R. (author) / Choi, C.-J. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 54 ; 1067-1072

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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