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Temperature dependence of electrical properties for MOS capacitor with HfO"2/SiO"2 gate dielectric stack
Temperature dependence of electrical properties for MOS capacitor with HfO"2/SiO"2 gate dielectric stack
Temperature dependence of electrical properties for MOS capacitor with HfO"2/SiO"2 gate dielectric stack
Yu, T. (author) / Jin, C. G. (author) / Dong, Y. J. (author) / Cao, D. (author) / Zhuge, L. J. (author) / Wu, X. M. (author) / Cheong, K. Y. / Paskaleva, A.
2013-01-01
7 pages
Article (Journal)
English
DDC:
621.38152
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