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    Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

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    Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm

    Contributors:

    Solookinejad, G. (author) / Rozatian, A. S. (author) / Habibi, M. H. (author)

    Published in:

    EXPERIMENTAL TECHNIQUES ; 38 ; 21-27

    Publication date:

    2014-01-01

    Size:

    7 pages

    ISSN:

    0732-8818

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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