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    ZnO thin film characterization by X-ray reflectivity optimization using genetic algorithm and Fourier transformation

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

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    ZnO thin film characterization by X-ray reflectivity optimization using genetic algorithm and Fourier transformation

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    ZnO thin film characterization by X-ray reflectivity optimization using genetic algorithm and Fourier transformation

    New search for: Solookinejad, G.
    New search for: Rozatian, A. S.
    New search for: Habibi, M. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    ZnO thin film characterization by X-ray reflectivity optimization using genetic algorithm and Fourier transformation

    Contributors:

    Solookinejad, G. (author) / Rozatian, A. S. (author) / Habibi, M. H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 260-264

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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