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Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm
Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm
Characterization of Zinc Oxide Thin Film Using Atomic Force Microscopy and Optimized X-Ray Reflectivity by Genetic Algorithm
Solookinejad, G. (Autor:in) / Rozatian, A. S. (Autor:in) / Habibi, M. H. (Autor:in)
EXPERIMENTAL TECHNIQUES ; 38 ; 21-27
01.01.2014
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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