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Formation of Double Stacking Faults from Polishing Scratches on 4H-SiC (0001) Substrate
Formation of Double Stacking Faults from Polishing Scratches on 4H-SiC (0001) Substrate
Formation of Double Stacking Faults from Polishing Scratches on 4H-SiC (0001) Substrate
Ushio, S. (author) / Fujimoto, T. (author) / Tsuge, H. (author) / Katsuno, M. (author) / Sato, S. (author) / Tani, K. (author) / Hirano, H. (author) / Yano, T. (author) / Okumura, H. / Harima, H.
2014-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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