Transmission electron microscopy study of amorphous Ge"2Sb"2Te"5 films induced by an ultraviolet single-pulse laser: Fid-Bau Portal

Transmission electron microscopy study of amorphous Ge"2Sb"2Te"5 films induced by an ultraviolet single-pulse laser

Zhao, J. J. / Liu, F. R. / Han, X. X. / Zhu, Z. / Lin, X. / Liu, F. / Sun, N. X.

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Transmission electron microscopy study of amorphous Ge"2Sb"2Te"5 films induced by an ultraviolet single-pulse laser

Zhao, J. J. / Liu, F. R. / Han, X. X. / Zhu, Z. / Lin, X. / Liu, F. / Sun, N. X.

Transmission electron microscopy study of amorphous Ge"2Sb"2Te"5 films induced by an ultraviolet single-pulse laser

Zhao, J. J. / Liu, F. R. / Han, X. X. / Zhu, Z. / Lin, X. / Liu, F. / Sun, N. X.

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Document information

Title:

Transmission electron microscopy study of amorphous Ge"2Sb"2Te"5 films induced by an ultraviolet single-pulse laser

Contributors:

Zhao, J. J. (author) / Liu, F. R. (author) / Han, X. X. (author) / Zhu, Z. (author) / Lin, X. (author) / Liu, F. (author) / Sun, N. X. (author)

Published in:

APPLIED SURFACE SCIENCE ; 311 ; 83-88

Publication date:

2014-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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