AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates: Fid-Bau Portal

AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates

Dallaeva, D. / Talu, S. / Stach, S. / Skarvada, P. / Tomanek, P. / Grmela, L.

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AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates

Dallaeva, D. / Talu, S. / Stach, S. / Skarvada, P. / Tomanek, P. / Grmela, L.

AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates

Dallaeva, D. / Talu, S. / Stach, S. / Skarvada, P. / Tomanek, P. / Grmela, L.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates

Contributors:

Dallaeva, D. (author) / Talu, S. (author) / Stach, S. (author) / Skarvada, P. (author) / Tomanek, P. (author) / Grmela, L. (author)

Published in:

APPLIED SURFACE SCIENCE ; 313 ; 81-86

Publication date:

2014-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Dallaeva, D. / Talu, S. / Stach, S. et al. | British Library Online Contents | 2014

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