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Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

Nowak, D. / Stafiniak, A. / Dziedzic, A.

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Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

Nowak, D. / Stafiniak, A. / Dziedzic, A.

Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

Nowak, D. / Stafiniak, A. / Dziedzic, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

Contributors:

Nowak, D. (author) / Stafiniak, A. (author) / Dziedzic, A. (author)

Published in:

MATERIALS SCIENCE -WROCLAW- ; 32 ; 247-251

Publication date:

2014-01-01

Size:

5 pages

ISSN:

0137-1339

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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