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Electromigration - a typical corrosion phenomenon in microelectronics

Schmitt-Thomas, K. G. / Wege, S. / Schweigart, H.

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Electromigration - a typical corrosion phenomenon in microelectronics

Schmitt-Thomas, K. G. / Wege, S. / Schweigart, H.

Electromigration - a typical corrosion phenomenon in microelectronics

Schmitt-Thomas, K. G. / Wege, S. / Schweigart, H.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electromigration - a typical corrosion phenomenon in microelectronics

Contributors:

Schmitt-Thomas, K. G. (author) / Wege, S. (author) / Schweigart, H. (author)

Published in:

WERKSTOFFE UND KORROSION -WEINHEIM- ; 46 ; 366

Publication date:

1995-01-01

Size:

366 pages

ISSN:

0043-2822

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11223

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