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Surface Roughness in Alumina Thin Film Deposited on Silica Using Oblique Incidence

He, L.J. / Li, C. / Liu, X.Z.

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Surface Roughness in Alumina Thin Film Deposited on Silica Using Oblique Incidence

He, L.J. / Li, C. / Liu, X.Z.

Surface Roughness in Alumina Thin Film Deposited on Silica Using Oblique Incidence

He, L.J. / Li, C. / Liu, X.Z.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Surface Roughness in Alumina Thin Film Deposited on Silica Using Oblique Incidence

Contributors:

He, L.J. (author) / Li, C. (author) / Liu, X.Z. (author)

Published in:

MATERIALS SCIENCE FORUM ; 787 ; 373-377

Publication date:

2014-01-01

Size:

5 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

He, L. / Li, C. / Liu, X. | British Library Online Contents | 2014

Preparation of highly oriented polycrystalline AlN thin films deposited on glass at oblique-angle incidence

Rodriguez-Navarro, A. / Otao-Rivera, W. / Garcia-Ruiz, J. M. et al. | British Library Online Contents | 1997

The optical properties of alumina films prepared by electron beam evaporation at oblique incidence

He, L. j. / Li, C. / Liu, X. z. | British Library Online Contents | 2013

Surface Waves of Oblique Incidence Across Deep Infilled Trenches

Lee, Jong S. | Online Contents | 1995

Wave diffraction for oblique incidence

Lacombe, H. | Engineering Index Backfile | 1951