Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers: Fid-Bau Portal

Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers

Lin, T. W. / Rowe, L. P. / Kaczkowski, A. J. / Horn, G. P. / Johnson, H. T.

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Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers

Lin, T. W. / Rowe, L. P. / Kaczkowski, A. J. / Horn, G. P. / Johnson, H. T.

Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers

Lin, T. W. / Rowe, L. P. / Kaczkowski, A. J. / Horn, G. P. / Johnson, H. T.

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Check availability in my library

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Document information

Title:

Polarization-Resolved Imaging for Both Photoelastic and Photoluminescence Characterization of Photovoltaic Silicon Wafers

Contributors:

Lin, T. W. (author) / Rowe, L. P. (author) / Kaczkowski, A. J. (author) / Horn, G. P. (author) / Johnson, H. T. (author)

Published in:

EXPERIMENTAL MECHANICS ; 56 ; 1339-1350

Publication date:

2016-01-01

Size:

12 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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