Finite Element Analysis of Failure in Cu Interconnect Megasonic Cleaning

Huang, Y.T. / Meng, C.L. / Wu, N.P. et al. | British Library Online Contents | 2013

Analysis of failure mechanisms in the interconnect lines of microelectronic circuits

Bower, A. F. / Craft, D. | British Library Online Contents | 1998

Using Model Updating to Predict the Failure of Reinforced Concrete Elements

Rafiq, Yaqub M. Y. / Al-Farttoosi, M. | ASCE | 2013

Using Model Updating to Predict the Failure of Reinforced Concrete Elements

Rafiq, Y.M.Y. / Al-Farttoosi, M. / American Society of Civil Engineers | British Library Conference Proceedings | 2013

Physical failure analysis in semiconductor industry-challenges of the copper interconnect process

Zschech, E. / Langer, E. / Engelmann, H. J. et al. | British Library Online Contents | 2002