A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Analysis of failure mechanisms in the interconnect lines of microelectronic circuits
Analysis of failure mechanisms in the interconnect lines of microelectronic circuits
Analysis of failure mechanisms in the interconnect lines of microelectronic circuits
Bower, A. F. (author) / Craft, D. (author)
FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 21 ; 611-630
1998-01-01
20 pages
Article (Journal)
English
DDC:
620.1123
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