Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction: Fid-Bau Portal

Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Wyss, A. / Sologubenko, A. S. / Mishra, N. / Gruber, P. A. / Spolenak, R.

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Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Wyss, A. / Sologubenko, A. S. / Mishra, N. / Gruber, P. A. / Spolenak, R.

Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Wyss, A. / Sologubenko, A. S. / Mishra, N. / Gruber, P. A. / Spolenak, R.

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Check availability in my library

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Document information

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Document information

Title:

Monitoring of stress–strain evolution in thin films by reflection anisotropy spectroscopy and synchrotron X-ray diffraction

Contributors:

Wyss, A. (author) / Sologubenko, A. S. (author) / Mishra, N. (author) / Gruber, P. A. (author) / Spolenak, R. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 52 ; 6741-6753

Publication date:

2017-01-01

Size:

13 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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