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Effects of Crack Size Distribution and Voltage Probe Spacing on Variation of Critical Current and n-Value along the Longitudinal Direction in Superconducting Tape with Cracks
Effects of Crack Size Distribution and Voltage Probe Spacing on Variation of Critical Current and n-Value along the Longitudinal Direction in Superconducting Tape with Cracks
Effects of Crack Size Distribution and Voltage Probe Spacing on Variation of Critical Current and n-Value along the Longitudinal Direction in Superconducting Tape with Cracks
Ochiai, Shojiro (author) / Okuda, Hiroshi (author) / Fujii, Noriyuki (author)
Materials transactions ; 59 ; 1380-1388
2018-01-01
9 pages
Article (Journal)
English
DDC:
620.1105
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