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Electron channelling contrast imaging for III-nitride thin film structures
Electron channelling contrast imaging for III-nitride thin film structures
Electron channelling contrast imaging for III-nitride thin film structures
Naresh-Kumar, G. (author) / Thomson, D. (author) / Nouf-Allehiani, M. (author) / Bruckbauer, J. (author) / Edwards, P.R. (author) / Hourahine, B. (author) / Martin, R.W. (author) / Trager-Cowan, C. (author)
Materials science in semiconductor processing ; 47 ; 44-50
2016-01-01
7 pages
Article (Journal)
English
DDC:
621.38152
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Reprint of: Electron channelling contrast imaging for III-nitride thin film structures
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