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    Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

    New search for: Weidner, A.
    New search for: Glage, A.
    New search for: Sperling, L.
    New search for: Biermann, H.

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    Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

    New search for: Weidner, A.
    New search for: Glage, A.
    New search for: Sperling, L.
    New search for: Biermann, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

    New search for: Weidner, A.
    New search for: Glage, A.
    New search for: Sperling, L.
    New search for: Biermann, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Observation of stacking faults in a scanning electron microscope by electron channelling contrast imaging

    Contributors:

    Weidner, A. (author) / Glage, A. (author) / Sperling, L. (author) / Biermann, H. (author)

    Published in:

    INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 102 ; 3-5

    Publication date:

    2011-01-01

    Size:

    3 pages

    ISSN:

    1862-5282

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  669.9

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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