Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods

    New search for: Romanitan, Cosmin
    New search for: Gavrila, Raluca
    New search for: Danila, Mihai

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods

    New search for: Romanitan, Cosmin
    New search for: Gavrila, Raluca
    New search for: Danila, Mihai

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods

    New search for: Romanitan, Cosmin
    New search for: Gavrila, Raluca
    New search for: Danila, Mihai

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods

    Contributors:

    Romanitan, Cosmin (author) / Gavrila, Raluca (author) / Danila, Mihai (author)

    Published in:

    Materials science in semiconductor processing ; 57 ; 32-38

    Publication date:

    2017-01-01

    Size:

    7 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Comparative study of threading dislocations in GaN epitaxial layers by nondestructive methods

    Romanitan, Cosmin / Gavrila, Raluca / Danila, Mihai | British Library Online Contents | 2017

    Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

    Simoen, E. / Brouwers, G. / Eneman, G. et al. | British Library Online Contents | 2008

    Threading dislocations in Ba0.7Sr0.3TiO3/La0.7Sr0.3MnO3 epitaxial films grown on (001) LaAlO3 substrate

    Qi, X. Y. / Miao, J. / Duan, X. F. et al. | British Library Online Contents | 2006

    Conversion of Basal Plane Dislocations to Threading Edge Dislocations in Growth of Epitaxial Layers on 4H-SiC Substrates with a Vicinal Off-Angle

    Masumoto, K. / Ito, S. / Goto, H. et al. | British Library Online Contents | 2014

    A finite element study of threading dislocations

    Stigh, U. | British Library Online Contents | 1993

    Back to top