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    Thickness-dependent optoelectronic properties of CuCr0.93Mg0.07O2 thin films deposited by reactive magnetron sputtering

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    Thickness-dependent optoelectronic properties of CuCr0.93Mg0.07O2 thin films deposited by reactive magnetron sputtering

    New search for: Sun, Hui
    New search for: Ducros, Cedric
    New search for: Chen, Sheng-Chi
    New search for: Aubry, Eric
    New search for: Wen, Chao-Kuang
    New search for: Hsieh, Jang-Hsing
    New search for: Sanchette, Frederic
    New search for: Billard, Alain

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness-dependent optoelectronic properties of CuCr0.93Mg0.07O2 thin films deposited by reactive magnetron sputtering

    New search for: Sun, Hui
    New search for: Ducros, Cedric
    New search for: Chen, Sheng-Chi
    New search for: Aubry, Eric
    New search for: Wen, Chao-Kuang
    New search for: Hsieh, Jang-Hsing
    New search for: Sanchette, Frederic
    New search for: Billard, Alain

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Thickness-dependent optoelectronic properties of CuCr0.93Mg0.07O2 thin films deposited by reactive magnetron sputtering

    Contributors:

    Sun, Hui (author) / Arab Pour Yazdi, Mohammad (author) / Ducros, Cedric (author) / Chen, Sheng-Chi (author) / Aubry, Eric (author) / Wen, Chao-Kuang (author) / Hsieh, Jang-Hsing (author) / Sanchette, Frederic (author) / Billard, Alain (author)

    Published in:

    Materials science in semiconductor processing ; 63 ; 295-302

    Publication date:

    2017-01-01

    Size:

    8 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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